On-Wafer Measurement
Probe Tips

Microwave Measurements

For characterization of devices and circuits as well as for model verification, FBH relies on high-level measurement equipment and a dedicated group. The following measurements are covered:

  • S parameter measurements 20 kHz to 110 GHz
  • Noise characterization including low-frequency noise
  • Phase-noise characterization
  • Load-pull measurements of high-power transistors (2-10 GHz, 10+ W)
  • Thermal impedance measurements

These procedures are routinely performed within the current research activities. The FBH expertise, however, is also available for external partners and customers in the framework of projects and contracts (consulting, measurement).

Contact

Dr. Roland Gesche
 Phone +49.30.6392-2643
 Fax +49.30.6392-2642
 Email  roland.gesche(at)fbh-berlin.de