On-Wafer Testing
On-Wafer Testing of GaAs Power Schottky Diodes

DC Device Characterization

Automatic function control and inking of fully processed wafers

Equipment

  • 1 semi automatic waferprober
  • Device measurement capabilities up to 3 A (21 V) and 1 kV (20 mA)
  • Planar and vertical measurements

Contact

André Dounia
 Phone +49.30.6392-3209
 Fax +49.30.6392-2685
 Email andre.dounia(at)fbh-berlin.de