Microwave Measurements

For characterization of devices and circuits as well as for model verification, FBH relies on high-level measurement equipment and a dedicated group. The following measurements are covered:

  • S-parameter measurements up to 500 GHz
  • Pulsed DC and pulsed S-parameter measurements up to 50 GHz
  • Power and spectrum up to 750 GHz
  • On-wafer load-pull with IMD and modulation up to 26.5 GHz
  • Fixture-based high-power load-pull up to 8 GHz
  • Non-linear VNA with load-pull (X-parameters coming)
  • 50 Ohm amplifier characterization with DPD, 80 MHz IQ bandwidth
  • Digital PA measurements
  • High-frequency and low-frequency noise measurements, as well as phase-noise characterization
  • Thermal impedance measurements
  • On-wafer measurement
    [+] On-wafer measurement
  • On-wafer microwave measurement
    [+] On-wafer microwave measurement

These procedures are routinely performed within the current research activities. The FBH expertise, however, is also available for external partners and customers in the framework of projects and contracts (consulting, measurement).