Comprehensive electronic THz circuit characterization

Electronic devices and circuits at THz frequencies can be tested at FBH using an on-wafer measurement system up to 500 GHz. The equipment features precise semi-automatic probing (accuracy < 3 µm) and can map entire wafers without manual assistance. FBH has demonstrated low-loss interconnects (insertion loss below 0.5 dB up to 300 GHz) as well as calibration standards and methods with predictable performance up to 500 GHz.

On-wafer terahertz measurement setup
On-wafer terahertz measurement setup

FBH also cooperates with NIST, PTB, and industrial partners on calibration hardware and software, leading to verifiable high-accuracy results. Key focus of these activities is to overcome the inherent multi-mode waveguide propagation along with radiation and coupling effects on wafers at frequencies above 100 GHz. FBH further operates a spectrum analysis tool for oscillator and power amplifier characterization up to 750 GHz, as well as characterization facilities up to 2500 GHz based on Toptica terahertz spectroscopy platform TERASCAN 1550.