On Compact HBT RF Noise Modeling

M. Rudolph, P. Heymann

Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany

Published in:
IEEE MTT-S Int. Microwave Symp. Dig., 2007, 1783-1786.
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Abstract:
Accurate RF noise modeling of heterojunction bipolar transistors requires a proper model for the correlation of the shot-noise sources based on the respective time constant. This is incompatible with the present large-signal models, which, therefore, rely on non-correlated shot-noise sources and are not capable of predicting the RF noise with sufficient accuracy. In this paper, we propose a new configuration of the shot-noise sources which approximates the correlation by taking advantage of the large-signal model's equivalent circuit topology. The model is verified by measurements.

Index Terms:
Heterojunction bipolar transistor, semiconductor device modeling, equivalent circuit, Noise, Semiconductor device noise, Shot noise, White noise

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