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On Compact HBT RF Noise Modeling
M. Rudolph, P. Heymann
Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
Published in:
IEEE MTT-S Int. Microwave Symp. Dig., 2007, 1783-1786.
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Abstract:
Accurate RF noise modeling of heterojunction bipolar
transistors requires a proper model for the correlation of
the shot-noise sources based on the respective time constant.
This is incompatible with the present large-signal models, which,
therefore, rely on non-correlated shot-noise sources and are not
capable of predicting the RF noise with sufficient accuracy. In
this paper, we propose a new configuration of the shot-noise
sources which approximates the correlation by taking advantage
of the large-signal model's equivalent circuit topology. The model
is verified by measurements.
Index Terms:
Heterojunction bipolar transistor, semiconductor
device modeling, equivalent circuit, Noise, Semiconductor
device noise, Shot noise, White noise
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