Microsystem Light Source at 488 nm for Shifted Excitation Resonance Raman Difference Spectroscopy

M. Maiwald1, H. Schmidt2, B. Sumpf1, R. Güther1, G. Erbert1, H.-D. Kronfeldt2, G. Tränkle1

Published in:

Appl. Spectrosc., vol. 63, no. 11, pp. 1283-1287 (2009).

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Abstract:

A microsystem light source emitting at 488 nm was tested and applied as a light source for shifted excitation resonance Raman difference spectroscopy (SERRDS). A nonlinear frequency conversion using a distributed feedback (DFB) diode laser emission at 976 nm and a periodically poled lithium niobate (PPLN) waveguide crystal was realized on a micro-optical bench with a footprint of 25 mm × 5 mm. Joint temperature management via the microbench is used for wavelength tuning. Two emission lines at 487.61 nm and 487.91 nm are used for the SERRDS experiments. The Raman spectra of the test sample polystyrene demonstrate that a laser bandpass filter did not need to be implemented. Resonance Raman spectra of Tartrazine (FD&C Yellow 5, E 102) in distilled water are presented to demonstrate the suitability of this light source for SERRDS in, e.g., food safety control.

1 Ferdinand-Braun-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
2 Technische Universität Berlin, Institut für Optik und Atomare Physik, Hardenbergstr. 36, D-10623 Berlin, Germany

Keywords:

microsystem light source, diode laser, second-harmonic generation; SHG, 488 nm; Raman spectroscopy; shifted excitation resonance RRaman difference spec, SERRDS; food safety control.