Reliable Operation for 14 500 h of a Wavelength-Stabilized Diode Laser System on a Microoptical Bench at 671 nm
IEEE Trans. Compon. Packag. Technol., vol. 2, no. 1, pp. 116-121 (2012).
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Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm × 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 °C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.
1 Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik, Gustav-Kirchhoff-Straße 4, D-12489 Berlin, Germany
2 Department of Chemistry/Physical Chemistry, University of Potsdam, Potsdam 14476, Germany
3 Department of Photonics Engineering, Technical University of Denmark, Roskilde 4000, Denmark
High-power lasers, laser resonators, Raman spectroscopy, reliability, semiconductor lasers.